Formal verification of the UltraSPARCTM family of processors via ATPG methods

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 849-856

  Levitt, Marc E ^a  

^a Sun Microelectronics   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT TESTING;

AUTOMATIC TEST PATTERN GENERATION (ATPG); DECODED MULTIPLEXORS;

MICROPROCESSOR CHIPS;

EID: 0030398787     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)