SIMS and RBS analysis of leached glass : Reliability of RSF method for SIMS quantification

Journal of Materials Science: Materials in Electronics

Volumn 7, Issue 6, 1996, Pages 373-379

  Salem, A A ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COMPOSITION; LEACHING; OXYGEN; RELIABILITY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SILICON; SPUTTERING;

LEACHED GLASS; MATRIX EFFECT; RELATIVE SENSITIVITY FACTOR;

GLASS;

EID: 0030398112     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00180772     Document Type: Article

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