On functional relation between class-selective rejection error and average number of classes

IEEE International Joint Symposia on Intelligence and Systems

Volumn , Issue , 1996, Pages 282-287

  Ha, Thien M ^a  

^a UNIVERSITY OF BERN   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS;

CLASS SELECTIVE REJECTION FUNCTION; ERROR RATE;

PATTERN RECOGNITION;

EID: 0030398037     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)