Metrics, techniques and recent developments in mixed-signal testing

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1996, Pages 514-521

  Roberts, Gordon W ^a  

^a MCGILL UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE;

MIXED SIGNAL DEVICE;

DIGITAL INTEGRATED CIRCUITS;

EID: 0030397949     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (23)