Rietveld refinement using Debye-Scherrer film techniques

Materials Science Forum

Volumn 228-231, Issue PART 1, 1996, Pages 29-34

  Lutterotti, L ^a   Gualtieri, A ^b   Aldrighetti, S ^c  

^a UNIVERSITY OF TRENTO   (Italy)

^b UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

^c Officina Elettrotecnica di Tenno   (Italy)

Author keywords

Debye scherrer; Film Techniques; Rietveld Method; Structure Refinement

Indexed keywords

DATA ACQUISITION; DIFFRACTOMETERS; ERROR CORRECTION; INTERFACES (COMPUTER); PHOTOMETERS; SCINTILLATION COUNTERS;

BRAGG-BRENTANO DIFFRACTOMETER; DEBYE-SCHERRER FILM TECHNIQUES; RIETVELD METHOD;

X RAY POWDER DIFFRACTION;

EID: 0030397515     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.228-231.29     Document Type: Article

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