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Volumn 100, Issue 10, 1996, Pages 691-693
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Niobium nitride: Stability and integrity of the "NbO phase"
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DEPOSITION;
FILM GROWTH;
NIOBIUM;
PULSED LASER APPLICATIONS;
STOICHIOMETRY;
SUPERCONDUCTING FILMS;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
NIOBIUM NITRIDE;
ROCKSALT PHASE;
NITRIDES;
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EID: 0030397196
PISSN: 00381098
EISSN: None
Source Type: Journal
DOI: 10.1016/0038-1098(96)00582-0 Document Type: Article |
Times cited : (2)
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References (13)
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