|
Volumn 1, Issue , 1996, Pages 237-246
|
Ultra-low-power CMOS technologies
|
Author keywords
[No Author keywords available]
|
Indexed keywords
DIGITAL INTEGRATED CIRCUITS;
HEAT LOSSES;
INTEGRATED CIRCUIT LAYOUT;
MATHEMATICAL MODELS;
PERFORMANCE;
RELIABILITY;
POWER CONSUMPTION;
THRESHOLD VOLTAGES;
ULTRA LOW POWER;
CMOS INTEGRATED CIRCUITS;
|
EID: 0030396735
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (30)
|
References (30)
|