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Volumn 29, Issue 1, 1996, Pages 45-49
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Influence of surface layer damaging on photoelectromagnetic effect
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONS;
LASER BEAMS;
PHOTOCONDUCTIVITY;
PHOTOVOLTAIC EFFECTS;
REFRACTIVE INDEX;
SCANNING;
SEMICONDUCTOR DEVICES;
SILICON WAFERS;
SURFACES;
VELOCITY;
DIFFUSION PHOTOVOLTAGE;
SURFACE FILMS;
SURFACE LAYER;
SURFACE RECOMBINATION VELOCITY;
PHOTOELECTROMAGNETIC EFFECTS;
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EID: 0030396380
PISSN: 00709816
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
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Times cited : (1)
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References (15)
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