Effects of buffer layer processing on CIGS excess carrier lifetime: application of dual-beam optical modulation to process analysis

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 1996, Pages 821-824

  Li, Sheng S ^a   Stanbery, B J ^a   Huang, C H ^a   Chang, C H ^a   Chang, Y S ^a   Anderson, T J ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; LIGHT MODULATION; NONDESTRUCTIVE EXAMINATION; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS; THIN FILM DEVICES;

BUFFER LAYERS; CADMIUM SULFIDE; DUAL BEAM OPTICAL MODULATION; EXCESS CARRIER LIFETIME;

COPPER COMPOUNDS;

EID: 0030395651     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)