Thermodynamics and microstructure development in the thin film reaction of aluminum on silicon carbide

Materials Research Society Symposium - Proceedings

Volumn 403, Issue , 1996, Pages 489-494

  Hayes, T S ^a   Ray, F T ^a   Trumble, K P ^a   Kvam, E P ^a  

^a PURDUE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; CHEMICAL REACTIONS; INTERFACES (MATERIALS); MICROSTRUCTURE; OHMIC CONTACTS; SATURATION (MATERIALS COMPOSITION); SILICON CARBIDE; THERMODYNAMICS; THIN FILMS;

ALUMINUM CARBIDE; INTERFACIAL RESISTIVITY; THERMODYNAMIC ANALYSIS; THIN FILM REACTION;

ALUMINUM;

EID: 0030395263     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)