Power integrity of 980 nm pump lasers at 200 mW and above

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 1, Issue , 1996, Pages 348-349

  Oosenbrug, Albert ^a   Harder, Christoph S ^a   Jakubowicz, Abram ^a   Roentgen, Peter ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; LIGHT REFLECTION; MIRRORS; MOLECULAR BEAM EPITAXY; PUMPING (LASER); SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR GROWTH; STRESSES;

BACK MIRROR ABSORPTION; BULK RELATED DEFECTS; MIRROR RELATED DEFECTS;

QUANTUM WELL LASERS;

EID: 0030395104     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)