Investigation of power MOSFET switching at cryogenic temperatures

IEEE Conference Record of Power Modulator Symposium

Volumn , Issue , 1996, Pages 47-50

  Giesselmann, M ^a   Mahmud, Zia ^a   Carson, Scott ^a  

^a TEXAS TECH UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN OF SOLIDS; ELECTRIC CONDUCTIVITY OF SOLIDS; LOW TEMPERATURE OPERATIONS; POWER ELECTRONICS; SEMICONDUCTOR DEVICE TESTING;

CONDUCTION LOSSES;

MOSFET DEVICES;

EID: 0030395067     PISSN: 10768467     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)