Properties of high-power cryo-MOSFETs

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 3, Issue , 1996, Pages 1443-1448

  Mueller, Otward ^a  

^a AMERICAN SUPERCONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC CURRENT MEASUREMENT; ELECTRIC RESISTANCE; ELECTRON TRANSPORT PROPERTIES; HEAT RESISTANCE; HEAT SINKS; NITROGEN; POWER ELECTRONICS; SEMICONDUCTOR SWITCHES; THERMAL EFFECTS;

CRYOGENIC TEMPERATURE; DRAIN CURRENTS; ELECTRON MOBILITY; LIQUID NITROGEN;

MOSFET DEVICES;

EID: 0030394977     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (22)