Heavy ions evaluation of GaAs microwave devices

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1996, Pages 88-90

  Barillot, Catherine ^a   Bensoussan, Alain ^a   Brasseau, Francis ^a   Calvel, Philippe ^a  

^a THALES ALENIA SPACE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ION BOMBARDMENT; RISK ASSESSMENT; SEMICONDUCTING GALLIUM ARSENIDE; SENSITIVITY ANALYSIS; SPACE APPLICATIONS;

HEAVY IONS; SINGLE EVENT BURNOUT;

MICROWAVE DEVICES;

EID: 0030394679     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)