New SOI inverter for low power applications

IEEE International SOI Conference

Volumn , Issue , 1996, Pages 20-21

  Chung, In Young ^a   Park, Young June ^a   Min, Hong Shick ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE MEASUREMENT; CMOS INTEGRATED CIRCUITS; DELAY CIRCUITS; ELECTRIC LOADS; GATES (TRANSISTOR); INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS; MOSFET DEVICES; SILICON ON INSULATOR TECHNOLOGY;

PROPAGATION DELAY; THRESHOLD VOLTAGE;

ELECTRIC INVERTERS;

EID: 0030394559     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (1)