Basic and applied atomic spectroscopy in high-field ion diode acceleration gaps

Laser and Particle Beams

Volumn 14, Issue 4, 1996, Pages 543-553

  Bailey, J E ^a   Filuk, A B ^a   Carlson, A L ^a   Johnson, D J ^a   Lake, P ^a   Mcguire, E J ^a   Mehlhorn, T A ^a   Pointon, T D ^a   Renk, T J ^a   Stygar, W A ^a   Maron, Y ^b   Stambulchik, E ^b  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; ELECTRIC FIELD MEASUREMENT; ION BEAMS; IONS; SCATTERING; TARGETS;

HIGH FIELD ION DIODE ACCELERATION GAPS; ION DIODE PHYSICS; STARK SHIFTED LINE EMISSION;

ATOMIC SPECTROSCOPY;

EID: 0030394308     PISSN: 02630346     EISSN: None     Source Type: Journal    
DOI: 10.1017/s0263034600010260     Document Type: Article

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