|
|
Volumn 436, Issue , 1996, Pages
|
|
Anisotropic behaviour of surface roughening in lattice mismatched heteroepitaxial thin films
a
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
ANISOTROPY;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
DIFFUSION;
DISLOCATIONS (CRYSTALS);
EPITAXIAL GROWTH;
MORPHOLOGY;
SEMICONDUCTING GERMANIUM COMPOUNDS;
SEMICONDUCTING SILICON;
SUBSTRATES;
SURFACE ROUGHNESS;
TRANSMISSION ELECTRON MICROSCOPY;
ANISOTROPIC DEPENDENCE;
HETEROEPITAXIAL THIN FILMS;
LATTICE MISMATCH;
MISFIT DISLOCATION NETWORK;
THIN FILMS;
|
|
EID: 0030393977
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-436-487 Document Type: Conference Review |
|
Times cited : (1)
|
|
References (5)
|
