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Volumn 436, Issue , 1996, Pages
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Anisotropic behaviour of surface roughening in lattice mismatched heteroepitaxial thin films
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
DIFFUSION;
DISLOCATIONS (CRYSTALS);
EPITAXIAL GROWTH;
MORPHOLOGY;
SEMICONDUCTING GERMANIUM COMPOUNDS;
SEMICONDUCTING SILICON;
SUBSTRATES;
SURFACE ROUGHNESS;
TRANSMISSION ELECTRON MICROSCOPY;
ANISOTROPIC DEPENDENCE;
HETEROEPITAXIAL THIN FILMS;
LATTICE MISMATCH;
MISFIT DISLOCATION NETWORK;
THIN FILMS;
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EID: 0030393977
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-436-487 Document Type: Conference Review |
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Times cited : (2)
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References (5)
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