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Volumn 290-291, Issue , 1996, Pages 513-517
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Thin-film tantalum-nitride resistor technology for phosphide-based optoelectronics
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Author keywords
Electrical properties; Integrated circuit technology; Tantalum nitride; Thin film resistors
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Indexed keywords
ELECTRIC CONDUCTIVITY OF SOLIDS;
OHMIC CONTACTS;
OPTOELECTRONIC DEVICES;
RESISTORS;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTING INDIUM PHOSPHIDE;
SPUTTER DEPOSITION;
TANTALUM COMPOUNDS;
THIN FILMS;
ELASTIC RECOIL DETECTION;
SEEBECK RATIO;
TANTALUM NITRIDE;
SEMICONDUCTING FILMS;
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EID: 0030393726
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/S0040-6090(06)08966-8 Document Type: Article |
Times cited : (24)
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References (6)
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