Sensitivity analysis of iterative design processes

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1996, Pages 142-145

  Johnson, E W ^a   Brockman, J B ^a   Vigeland, R ^a  

^a UNIVERSITY OF NOTRE DAME   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT; OPTIMIZATION; SENSITIVITY ANALYSIS; STATISTICAL METHODS;

ITERATIVE DESIGN PROCESSES; PARETO ANALYSIS; QUANTITATIVE DESIGN ANALYSIS;

COMPUTER AIDED LOGIC DESIGN;

EID: 0030393683     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)