Compact and complete test set generation for multiple stuck-faults

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1996, Pages 212-219

  Agrawal, Alok ^a   Saldanha, Alexander ^a   Lavagno, Luciano ^a   Sangiovanni Vincentelli, Alberto L ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; VECTORS;

AUTOMATIC TEST PATTERN GENERATION; BRANCH AND BOUND PROCEDURE; MULTIPLE STUCK FAULTS; SINGLE STUCK FAULTS;

COMBINATORIAL CIRCUITS;

EID: 0030393681     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)