Texture maps for orientation evolution during grain growth in thin films

Materials Research Society Symposium - Proceedings

Volumn 403, Issue , 1996, Pages 63-70

  Seel, Steven C ^a   Carel, Roland ^a   Thompson, Carl V ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ANNEALING; CRYSTAL ORIENTATION; DEPOSITION; INTERFACIAL ENERGY; MATHEMATICAL MODELS; SINGLE CRYSTALS; STRESSES; TEMPERATURE; TEXTURES; THIN FILMS; YIELD STRESS;

STRAIN ENERGY ANISOTROPY; STRAIN ENERGY DENSITY; TEXTURE DEPENDENCE; TEXTURE MAPS;

GRAIN GROWTH;

EID: 0030393157     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)