Reliability of high-power AlGaAs/GaAs QW laser diodes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2886, Issue , 1996, Pages 36-49

  Dabkowski, F P ^a   Pendse, D R ^a   Barrett, R J ^a   Chin, Aland K ^a   Jollay, Richard ^a   Clausen Jr , Edward M ^a   Hughes, L C ^a   Sanders, N B ^a  

^a POLAROID CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; ELECTRON BEAMS; FAILURE ANALYSIS; RELIABILITY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING ALUMINUM COMPOUNDS; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR DIODES; SEMICONDUCTOR QUANTUM WELLS;

ALUMINUM GALLIUM ARSENIDE; LASER DIODES;

SEMICONDUCTOR LASERS;

EID: 0030393049     PISSN: None     EISSN: None     Source Type: None    
DOI: 10.1117/12.251887     Document Type: Conference Paper

References (10)