Dose rate effects of a bipolar A/D converter

IEEE Radiation Effects Data Workshop

Volumn , Issue , 1996, Pages 38-43

  Youk, Geun U ^a  

^a UNIVERSITY OF FLORIDA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; BIPOLAR INTEGRATED CIRCUITS; DOSIMETRY; FAILURE ANALYSIS; RADIATION EFFECTS; THERMAL EFFECTS;

DOSE RATE EFFECTS; TOTAL IONIZING DOSE (TID);

ANALOG TO DIGITAL CONVERSION;

EID: 0030392786     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)