Surface analysis using multiple coherent beams

Proceedings - IEEE Convention of Electrical & Electronics Engineers in Israel

Volumn , Issue , 1996, Pages 537-540

  Friedmann, Michael ^a   Piestun, Rafael ^a   Paquet, Eric ^a   Shamir, Joseph ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL DEVICES; FOURIER TRANSFORMS; LIGHT MODULATION; LIGHTING; OPTICAL MICROSCOPY; OPTICAL VARIABLES MEASUREMENT; RANDOM PROCESSES; SCANNING; WAVELET TRANSFORMS;

CONFOCAL SCANNING OPTICAL MICROSCOPY TECHNIQUES; ELECTROOPTICAL SYSTEMS; FOCUSED BEAMS; MULTIPLE COHERENT BEAMS; SURFACE REFLECTIVITY;

SURFACE STRUCTURE;

EID: 0030392431     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)