Yield prediction by sampling with the EYES tool

IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 1996, Pages 39-47

  Allan, Gerard A ^a   Walton, Anthony J ^a  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED LOGIC DESIGN; INTEGRATED CIRCUIT LAYOUT; LOGIC DEVICES;

CRITICAL AREAS; SOFTWARE PACKAGE EDINBURGH YIELD ESTIMATOR SAMPLING (EYES); YIELD PREDICTION;

ULSI CIRCUITS;

EID: 0030392137     PISSN: 10636722     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (20)