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Volumn , Issue , 1996, Pages 168-176
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Modeling quality reduction of multichip module systems due to uneven fault-coverage and imperfect diagnosis
a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRIC FAULT CURRENTS;
INTEGRATED CIRCUIT MANUFACTURE;
INTEGRATED CIRCUIT TESTING;
MARKOV PROCESSES;
SEMICONDUCTOR DEVICE MODELS;
QUALITY REDUCTION MODEL;
MULTICHIP MODULES;
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EID: 0030392135
PISSN: 10636722
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (7)
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References (18)
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