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Volumn 35, Issue 12 A, 1996, Pages 5946-5954

Analysis of ellipsometric and thermoreflectance spectra for P-based III-V compounds GaP and InP

Author keywords

Critical point; Dielectric constant; GaP; InP; Modulation spectroscopy; Spectroscopic ellipsometry; Thermoreflectance

Indexed keywords

CRITICAL POINTS; INTERBAND TRANSITIONS; MODULATION SPECTROSCOPY; SPECTROSCOPIC ELLIPSOMETRY (SE); THERMOREFLECTANCE (TR) SPECTRA;

EID: 0030392110     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.5946     Document Type: Article
Times cited : (7)

References (37)
  • 20
    • 4243193244 scopus 로고    scopus 로고
    • note
    • Supplied from Furu-uti Chemical Co., Japan. The detailed composition was not disclosed.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.