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Volumn 35, Issue 12 A, 1996, Pages 5946-5954
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Analysis of ellipsometric and thermoreflectance spectra for P-based III-V compounds GaP and InP
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Author keywords
Critical point; Dielectric constant; GaP; InP; Modulation spectroscopy; Spectroscopic ellipsometry; Thermoreflectance
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Indexed keywords
CRITICAL POINTS;
INTERBAND TRANSITIONS;
MODULATION SPECTROSCOPY;
SPECTROSCOPIC ELLIPSOMETRY (SE);
THERMOREFLECTANCE (TR) SPECTRA;
ELECTRON TRANSITIONS;
ELLIPSOMETRY;
ENERGY GAP;
LIGHT MODULATION;
PERMITTIVITY;
PHOTONS;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING INDIUM PHOSPHIDE;
SPECTROSCOPIC ANALYSIS;
PHOSPHORUS COMPOUNDS;
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EID: 0030392110
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.35.5946 Document Type: Article |
Times cited : (7)
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References (37)
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