The as-grown SiC(0001) surface as observed by reflection electron microscopy

Crystal Research and Technology

Volumn 31, Issue 8, 1996, Pages 1001-1005

  Marek, T ^a   Heindl, J ^a   Strunk, H P ^a   Eckstein, R ^b,c   Muller St G ^b,c   Hofmann, D ^b,c  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b Lehrst Werkstoffe der Elektrotech ^*

^c Inst für Werkstoffwiss VI   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALS; ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; VAPOR PHASE EPITAXY;

REFLECTION ELECTRON MICROSCOPY (REM);

SILICON CARBIDE;

EID: 0030392084     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.2170310807     Document Type: Article

References (11)

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