Commercial design verification: Methodology and tools

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 839-848

  Pixley, Carl ^a   Strader, Noel R ^a   Bruce, W C ^a   Park, Jaehong ^a   Kaufmann, Matt ^a   Shultz, Kurt ^a   Burns, Michael ^a   Kumar, Jai ^a   Yuan, Jun ^a   Nguyen, Janet ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; SEMICONDUCTOR DEVICE MODELS;

INTEGRATED CIRCUIT DESIGN VERIFICATION;

INTEGRATED CIRCUIT LAYOUT;

EID: 0030389594     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (24)