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Volumn , Issue , 1996, Pages 313-322

CostAS - KGD process cost modeling

Author keywords

[No Author keywords available]

Indexed keywords

AVAILABILITY; COSTS; ELECTRONICS PACKAGING; INTEGRATED CIRCUIT LAYOUT; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; OPTIMIZATION;

EID: 0030389245     PISSN: 10632204     EISSN: None     Source Type: None    
DOI: 10.1109/ICISS.1996.552438     Document Type: Conference Paper
Times cited : (2)

References (11)
  • 1
    • 0008757053 scopus 로고
    • Hybrid-WSI: A Massively Parallel Computing Technology?
    • C. M. Habiger R. M. Lea Hybrid-WSI: A Massively Parallel Computing Technology? IEEE Computer 50 61 April 1993
    • (1993) IEEE Computer , pp. 50-61
    • Habiger, C.M.1    Lea, R.M.2
  • 2
    • 0006521811 scopus 로고
    • An Investigation into the Cost-Effectiveness of Multi-Chip Modules for Massively Parallel Computing Applications
    • Hartung-Gorre Verlag Konstanz
    • C. M. Habiger An Investigation into the Cost-Effectiveness of Multi-Chip Modules for Massively Parallel Computing Applications 1995 Hartung-Gorre Verlag Konstanz
    • (1995)
    • Habiger, C.M.1
  • 3
    • 85176689156 scopus 로고    scopus 로고
  • 4
    • 85176684669 scopus 로고
    • Test strategies for multi-chip modules based on economics considerations
    • WSI
    • C. Dislis L. P. Jalowiecki Test strategies for multi-chip modules based on economics considerations 1995 WSI
    • (1995)
    • Dislis, C.1    Jalowiecki, L.P.2
  • 5
    • 85176674973 scopus 로고
    • Tradeoff Analysis and Partitioning in multiple Board/MCM Systems
    • ICEMCM
    • P. A. Sandborn A. R. Parikh Tradeoff Analysis and Partitioning in multiple Board/MCM Systems 1995 ICEMCM
    • (1995)
    • Sandborn, P.A.1    Parikh, A.R.2
  • 6
    • 0030400105 scopus 로고    scopus 로고
    • Multichip Module Yield Enhancement using Passive Substrate Fault Tolerance
    • C. Peacock H. Bolouri C. Habiger Multichip Module Yield Enhancement using Passive Substrate Fault Tolerance ISIS 1996
    • (1996) ISIS
    • Peacock, C.1    Bolouri, H.2    Habiger, C.3
  • 7
    • 85176674803 scopus 로고
    • An experimental Fault-Tolerant Active Substrate MPC MCM Using Standard Gate Array Technology
    • WSI
    • S. J. Hedge C. J. Hall An experimental Fault-Tolerant Active Substrate MPC MCM Using Standard Gate Array Technology 1995 WSI
    • (1995)
    • Hedge, S.J.1    Hall, C.J.2
  • 8
    • 85176682532 scopus 로고
    • Reducing Cost and Ensuring On-time Delivery of HybridWSI Massively Parallel Computing Modules
    • WSI
    • C. M. Habiger R. M. Lea Reducing Cost and Ensuring On-time Delivery of HybridWSI Massively Parallel Computing Modules 1994 WSI
    • (1994)
    • Habiger, C.M.1    Lea, R.M.2
  • 9
    • 85176686624 scopus 로고
    • Micron: SRAM Die Datasheet S25A
    • Micron Techonology Inc.
    • Micron: SRAM Die Datasheet S25A September 1995 Micron Techonology Inc.
    • (1995)
  • 10
    • 85176685663 scopus 로고    scopus 로고
  • 11
    • 85176680768 scopus 로고    scopus 로고
    • SmartDie Product Overview Intel Corporation http://www.intel.com/design/smartdie/


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.