Microstructural characterization of Pb(Zr0.52Ti0.48)O3 thin films deposited on RuO2 electrodes by laser ablation

Materials Research Society Symposium - Proceedings

Volumn 433, Issue , 1996, Pages 249-253

  De Benedittis, A ^a   Di Cristoforo, A ^a   Mengucci, P ^a   Majni, G ^a   Diodati, A ^a   Leccabue, F ^a   Watts, B E ^a   Seuret, D ^a   Smeets, J ^a  

^a INFM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL MICROSTRUCTURE; DIELECTRIC FILMS; ELECTRODES; ELECTRON MICROSCOPY; FILM GROWTH; LASER ABLATION; LEAD COMPOUNDS; RUTHENIUM COMPOUNDS; THERMAL EFFECTS; THIN FILMS; VAPOR DEPOSITION; X RAY CRYSTALLOGRAPHY;

BOTTOM ELECTRODES; DIELECTRIC FATIGUE; FERROELECTRIC MEMORIES;

FERROELECTRIC MATERIALS;

EID: 0030389048     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)