Narrow-width design methodology for operational amplifiers in SOI technology

IEEE International SOI Conference

Volumn , Issue , 1996, Pages 22-23

  Cheung, Denny T Y ^a   Lau, Jack ^a   Fung, Samuel K H ^a   Chan, Philip C H ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC LOSSES; ELECTRIC NETWORK TOPOLOGY; FREQUENCY RESPONSE; GAIN CONTROL; INTEGRATED CIRCUIT LAYOUT; SILICON ON INSULATOR TECHNOLOGY; VOLTAGE MEASUREMENT;

ANALOG GAIN STAGES; COMPENSATION CAPACITANCE; NARROW WIDTH METHOD (NWM);

OPERATIONAL AMPLIFIERS;

EID: 0030388857     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/soi.1996.552474     Document Type: Conference Paper

References (6)