|
|
Volumn 430, Issue , 1996, Pages 53-58
|
|
Some aspects related to the transfer of microwave sensing technology
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
NONDESTRUCTIVE EXAMINATION;
PROCESS CONTROL;
SENSOR DATA FUSION;
SENSORS;
MICROWAVE SENSING;
MICROWAVE DEVICES;
|
|
EID: 0030388710
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-430-53 Document Type: Conference Paper |
|
Times cited : (5)
|
|
References (7)
|
