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Volumn 11, Issue 12, 1996, Pages 3017-3023

Photoelectron spectroscopy study of amorphous silicon-carbon alloys deposited by plasma-enhanced chemical vapor deposition

Author keywords

[No Author keywords available]

Indexed keywords

ALLOYING; AMORPHOUS ALLOYS; BAND STRUCTURE; CHEMICAL VAPOR DEPOSITION; ELECTRONS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LIGHT ABSORPTION; METHANE; PHOTOELECTRON SPECTROSCOPY; PLASMAS;

EID: 0030388628     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.1996.0383     Document Type: Article
Times cited : (5)

References (29)
  • 3
    • 0027806812 scopus 로고
    • Amorphous Silicon Technology-1993, edited by E. A. Schiff, M. J. Thompson, A. Madan, K. Tanaka, and P. G. LeComber Pittsburgh, PA
    • Y-M. Li, in Amorphous Silicon Technology-1993, edited by E. A. Schiff, M. J. Thompson, A. Madan, K. Tanaka, and P. G. LeComber (Mater. Res. Soc. Symp. Proc. 297, Pittsburgh, PA, 1993), p. 803.
    • (1993) Mater. Res. Soc. Symp. Proc. , vol.297 , pp. 803
    • Li, Y.-M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.