Overview of CMOS VLSI failure analysis and the importance of test and diagnostics

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 930-

  Vallett, David P ^a  

^a IBM MICROELECTRONICS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; COMPUTER SOFTWARE; ELECTRIC FAULT CURRENTS; ELECTRONICS PACKAGING; FAILURE ANALYSIS; FLIP CHIP DEVICES; INTEGRATED CIRCUIT TESTING; VLSI CIRCUITS;

LOGIC FAILURE;

CMOS INTEGRATED CIRCUITS;

EID: 0030388599     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)