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Volumn 423, Issue , 1996, Pages 513-518
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Electron scattering by native defects in III-V nitrides and their alloys
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
CRYSTAL DEFECTS;
DIELECTRIC FILMS;
ELECTRON SCATTERING;
FERMI LEVEL;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING INDIUM COMPOUNDS;
SEMICONDUCTOR DEVICE MODELS;
SEMICONDUCTOR DOPING;
ELECTRON MOBILITIES;
GALLIUM NITRIDES;
INDIUM NITRIDES;
NITRIDES;
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EID: 0030388589
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (1)
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References (29)
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