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Volumn , Issue , 1996, Pages 386-395
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BIST methodology for comprehensive testing of RAM with reduced heat dissipation
a
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Author keywords
[No Author keywords available]
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Indexed keywords
HEAT LOSSES;
RANDOM ACCESS STORAGE;
BUILT IN SELF TEST METHODOLOGY;
MEMORY MODULES;
INTEGRATED CIRCUIT TESTING;
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EID: 0030388486
PISSN: 10893539
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (29)
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References (11)
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