BIST methodology for comprehensive testing of RAM with reduced heat dissipation

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 386-395

  Cheung, Hugo ^a   Gupta, Sandeep K ^a  

^a Rockwell Semiconductor Systems ^*  (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HEAT LOSSES; RANDOM ACCESS STORAGE;

BUILT IN SELF TEST METHODOLOGY; MEMORY MODULES;

INTEGRATED CIRCUIT TESTING;

EID: 0030388486     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)