Maximizing the use of open-path FTIR for 24-hour monitoring around the process area of an industrial chemical facility

APCA Specialty Conference Proceedings SP

Volumn , Issue , 1996, Pages 333-344

  Perry, S H ^a   McKane, P L ^a   Pescatore, D E ^a   DuBois, A E ^a   Kricks, R J ^a  

^a ETG Services   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL PLANTS; DATA PROCESSING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; INDUSTRIAL EMISSIONS; MONITORING; QUALITY ASSURANCE;

REMOTE SENSING;

EID: 0030388408     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)