Characterization of visible and infrared (1.54 μm) luminescence from Er-doped porous Si

Materials Research Society Symposium - Proceedings

Volumn 422, Issue , 1996, Pages 137-142

  White, R ^a   Wu, X ^a   Hommerich, U ^a   Namavar, F ^a   Cremins Costa, A M ^a  

^a HAMPTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRIC EXCITATION; ION IMPLANTATION; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; POROUS SILICON; SEMICONDUCTOR DOPING; SILICON; THERMAL EFFECTS;

ERBIUM DOPED SILICON; INFRARED LUMINESCENCE; PHOTOLUMINESCENCE EXCITATION; POROUS SILICON NANOSTRUCTURES; VISIBLE LUMINESCENCE;

ERBIUM;

EID: 0030388244     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-422-137     Document Type: Conference Paper

References (11)