Defect-induced electrical signals in solid dielectric power cable and implications thereof for defect location

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 1, Issue , 1996, Pages 86-89

  Kuang, Jinbo ^a   Boggs, Steven ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; DIELECTRIC MATERIALS; ELECTRIC FAULT LOCATION; ELECTRIC SPACE CHARGE; FINITE ELEMENT METHOD; INDUCED CURRENTS; INTERFACES (MATERIALS); PARTIAL DISCHARGES;

DEFECT INDUCED ELECTRIC SIGNALS; NONLINEAR FINITE ELEMENT METHOD;

ELECTRIC CABLES;

EID: 0030388215     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)