Profile-driven generation of trace samples

Proceedings - IEEE International Conference on Computer Design: VLSI in Computers and Processors

Volumn , Issue , 1996, Pages 217-224

  Dubey, Pradeep K ^a   Nair, Ravi ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; REDUCED INSTRUCTION SET COMPUTING;

PROFILE DRIVEN SAMPLING; TRACE SAMPLING;

MICROPROCESSOR CHIPS;

EID: 0030388162     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)