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Volumn , Issue , 1996, Pages 765-768
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A HIGH SENSITIVITY Z-AXIS TORSIONAL SILICON ACCELEROMETER
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Author keywords
[No Author keywords available]
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Indexed keywords
ACCELEROMETERS;
SILICON WAFERS;
BANDWIDTH;
CAPACITANCE;
ELECTRODES;
FABRICATION;
MICROMACHINING;
NATURAL FREQUENCIES;
READOUT SYSTEMS;
SILICON SENSORS;
VOLTAGE MEASUREMENT;
AIR-GAPS;
CAPACITIVE ACCELEROMETERS;
COMB FINGERS;
DISSOLVED WAFER PROCESS;
HIGH ASPECT RATIO;
HIGH SENSITIVITY;
MICRO-MACHINED;
PULL-IN-VOLTAGE;
SILICON ACCELEROMETERS;
SUSPENSION BEAMS;
ASPECT RATIO;
ACCELEROMETERS;
DISSOLVED WAFER PROCESS;
INTERDIGITATED ELECTRODES;
SILICON ACCELEROMETERS;
VARYING OVERLAP AREA METHOD;
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EID: 0030388077
PISSN: 01631918
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IEDM.1996.554092 Document Type: Conference Paper |
Times cited : (18)
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References (8)
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