Transparent random access memory testing for pattern sensitive faults

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 9, Issue 3, 1996, Pages 251-266

  Karpovsky, M G ^a,d,e   Yarmolik, V N ^a,b,c  

^a Boston University   (United States)

^b Computer Systems Department ^*  (Belarus)

^c BELARUSIAN STATE UNIVERSITY OF INFORMATICS AND RADIOELECTRONICS   (Belarus)

^d Research Laboratory for Design and Testing of Computer Systems

^e IEEE

Author keywords

Built in self test; Memory testing; Pattern sensitive faults; Pseudoexhaustive memory testing; Random access memory; Signature analysis; Transparent memory testing

Indexed keywords

ERROR DETECTION; FAILURE ANALYSIS; RELIABILITY; STANDARDS; TESTING;

MEMORY TESTING; PATTERN SENSITIVE FAULTS; RANDOM ACCESS MEMORY; SIGNATURE ANALYSIS; TRANSPARENT MEMORY TESTING;

RANDOM ACCESS STORAGE;

EID: 0030386944     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF00134690     Document Type: Article

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