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Volumn 15, Issue 24, 1996, Pages 2162-2164
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Ultramicrotomy: A novel technique for preparing wear-debris samples for TEM analysis
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM ALLOYS;
CRYSTAL LATTICES;
CRYSTAL MICROSTRUCTURE;
SCANNING ELECTRON MICROSCOPY;
SPECIMEN PREPARATION;
TRANSMISSION ELECTRON MICROSCOPY;
WEAR OF MATERIALS;
SELECTED AREA DIFFRACTION (SAD) PATTERN;
ULTRAMICROTOMY;
WEAR DEBRIS;
METALLIC MATRIX COMPOSITES;
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EID: 0030386907
PISSN: 02618028
EISSN: None
Source Type: Journal
DOI: 10.1007/BF00241156 Document Type: Article |
Times cited : (1)
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References (6)
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