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Volumn , Issue , 1996, Pages 8-13
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Field-induced charged device model testing of magnetoresistive recording heads
a
a
Quantum
(United States)
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
COMPUTER SOFTWARE;
ELECTRIC FIELD EFFECTS;
EQUIVALENT CIRCUITS;
MAGNETORESISTANCE;
MATHEMATICAL MODELS;
SCANNING ELECTRON MICROSCOPY;
FIELD INDUCED CHARGED DEVICE MODEL (FCDM);
MAGNETIC RECORDING HEAD STRUCTURE;
MAGNETORESISTIVE RECORDING HEADS;
MAGNETIC HEADS;
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EID: 0030386833
PISSN: 07395159
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (11)
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References (16)
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