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Volumn , Issue , 1996, Pages 341-345
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Low power, testable dual edge triggered flip-flops
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Author keywords
[No Author keywords available]
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Indexed keywords
INTEGRATED CIRCUIT LAYOUT;
POWER ELECTRONICS;
TIMING CIRCUITS;
TRIGGER CIRCUITS;
VLSI CIRCUITS;
CLOCK NETWORK;
PROPAGATION DELAY;
FLIP FLOP CIRCUITS;
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EID: 0030386692
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (25)
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References (8)
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