Opens board test coverage: When is 99% really 40%?

IEEE International Test Conference (TC)

Volumn , Issue , 1996, Pages 333-339

  Tegethoff, Mick M V ^a   Parker, Kenneth P ^a   Lee, Ken ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER SIMULATION; ELECTRONICS PACKAGING; PRINTED CIRCUIT BOARDS; PROBABILITY;

ELECTRICAL TESTING TECHNIQUES; MULTIPLE POWER PIN CONNECTIONS;

INTEGRATED CIRCUIT TESTING;

EID: 0030386566     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)