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Volumn 3, Issue , 1996, Pages 1418-1424
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Current sharing for paralleled IGBT's using statistics method
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CURRENTS;
ELECTRIC VARIABLES MEASUREMENT;
NUMERICAL ANALYSIS;
PROBABILITY;
SEMICONDUCTOR DEVICE MODELS;
SEMICONDUCTOR DIODES;
STATISTICAL METHODS;
TEMPERATURE;
CURRENT IMBALANCE;
FORWARD VOLTAGE;
INSULATED GATE BIPOLAR TRANSISTORS;
INVERSE DIODES;
JUNCTION TEMPERATURE;
SATURATION VOLTAGE;
BIPOLAR TRANSISTORS;
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EID: 0030386531
PISSN: 01972618
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (11)
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References (4)
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