Mechanical characterization of shape memory micromaterials

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2880, Issue , 1996, Pages 108-118

  Kohl, Manfred ^a   Skrobanek, K D ^a   Goh, C M ^a   Allen, D M ^a  

^a KARLSRUHE INSTITUTE OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CHARACTERIZATION; FINITE ELEMENT METHOD; INTELLIGENT MATERIALS; STRAIN; STRESSES; THIN FILMS; TITANIUM ALLOYS;

DOUBLE-BEAM TEST DEVICES; MICROMATERIALS;

SHAPE MEMORY EFFECT;

EID: 0030385641     PISSN: None     EISSN: None     Source Type: None    
DOI: 10.1117/12.250972     Document Type: Conference Paper

References (19)