Overall equipment effectiveness (OEE) and cost measurement

Proceedings of the IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium

Volumn , Issue , 1996, Pages 137-140

  Konopka, John ^a   Trybula, Walt ^a  

^a SEMATECH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; MAINTENANCE; MATHEMATICAL MODELS; PRODUCTIVITY;

CAPACITY UTILIZATION BOTTLENECK EFFICIENCY SYSTEM (CUBES); TOTAL PRODUCTIVE MAINTENANCE (TPM);

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0030384716     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (0)